UV/Vis/NIR Spectrophotometer
Vibratory Polisher
Confocal Raman Microscope
SAXS/WAXS
Ellipsometer
Simultaneous DSC/TGA Analyzer
Benchtop X-Ray Diffractometer
Surface profiler
Grinder
Scanning Electron Microscope
Thermal Gravimetric Analyzer
Polisher
X-Ray Fluorescence Spectrometer
Ion Milling
Ion Sputter
Thermal Mechanical Analyzer
Precision Cutter
Precision Ion Polishing System
Vacuum Thin Film Sputter
Advanced Rheology Expanded System
High-resolution Transmission Electron Microscope
High-contrast Transmission Electron Microscope
Fourier Transform Infrared Microscopy
Multipurpose X-Ray Diffractometer
Time-of-Flight Secondary Ion Mass Spectrometry with Orbitrap analyzer
Research Atomic Force Microscope
Multifunctional Atomic Force Microscope
Multi-Technique Surface Analysis System（XPS, AES, UPS, LEIPS）
Powder X-Ray Diffractometer
Ultra-high Resolution Scanning Electron Microscope
Ultra-high Resolution Scanning Electron Microscope
Differential Scanning Calorimeter
Differential Scanning Calorimeter